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one day Lyme Disease Workshop on June 6th, 2013.


The National Institute of Technology and Standards (NIST) invites you to a one day Lyme Disease Workshop on June 6th, 2013.

The Workshop will be focused on the challenges of measurement in Lyme disease. The goal of this workshop is to accelerate the development of sensitive and specific tests for Early Lyme disease and Post-Treatment Lyme Disease Syndrome.





NIST Workshop on Lyme Disease

Purpose:

lyme disease collageThe National Institute of Technology and Standards (NIST) invites you to a one day Lyme Disease Workshop on June 6th, 2013. The Workshop will be focused on the challenges of measurement in Lyme disease. The goal of this workshop is to accelerate the development of sensitive and specific tests for Early Lyme disease and Post-Treatment Lyme Disease Syndrome.

tick on rulerThis workshop will provide a venue for discussion of a variety of promising technologies and techniques for addressing the measurement of Lyme disease. It is hoped that through increased awareness, research collaboration, and addressing the challenges of Lyme disease, that we may accelerate the time to development of effective biomarkers needed for more sensitive diagnosis as well as management of the range of outcomes that occur after treatment of the different stages of Lyme disease.

Participants:

The participants in this workshop are scientists and physician scientists from the academic, government and private sectors. In addition, individuals representing industry and philanthropic organizations involved in supporting research will be represented. The common thread uniting the audience will be a focus on advancing measurement tools for the better diagnosis and management of Lyme disease.

Organizing Committee:

  • John Aucott, Johns Hopkins
  • Joseph Breen, NIH-NIAID
  • Laurie Locascio, NIST
  • Carin Rollins, CR Consulting LLC
  • David Roth, Tick-Borne Disease Alliance
  • Mary Satterfield, NIST
  • James Serum (Chair), Scitek Ventures (retired)

Agenda:

Coming Soon

Proposed Format:

A single day workshop with various oral speakers in the morning, and breakout sessions in the afternoon.

Security Instructions:

If you are not registered, you will not be allowed on site.
Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. You can download the required form NIST-1260. Fill out the form and email to Mary Satterfield [mary.satterfield@nist.gov].